Lawson, W, Pilkington, RD and Hill, AE 2007, 'Modeling and analysis of the growth of copper dendrites in saturated conditions using a multilevel factorial design analysis' , Microelectronics International, 24 (2) , pp. 28-34.

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Abstract

Purpose – Tracks, pads and vias on printed circuit boards can suffer from a variety of problems, if the surfaces are contaminated with electricallyconducting substances. Aims to model a multilevel full-factorial design to study the effects of temperature, voltage and electrode gap on dendritic growth under saturated conditions, i.e. water droplet contamination. Design/methodology/approach – Preparation of several DC-biased combed-copper interdigitated capacitors placed in temperature-controlled water-filled cuvettes enabled the specific monitoring of dendrite activity. The monitoring used the detection of sharp current increase that accompany a dendritic short circuit condition. Findings – A high R2 polynomial model was produced and it was noted that increased voltages reduce the reliability impact of dendritic growth. Originality/value – The paper focuses on the reliability impact dendritic growth in saturated conditions.

Item Type:	Article
Themes:	Subjects / Themes > T Technology > TK Electrical engineering. Electronics Nuclear engineering Subjects outside of the University Themes
Schools:	Colleges and Schools > College of Science & Technology Colleges and Schools > College of Science & Technology > School of Computing, Science and Engineering Colleges and Schools > College of Science & Technology > School of Computing, Science and Engineering > Materials & Physics Research Centre
Journal or Publication Title:	Microelectronics International
Publisher:	Emerald Group Publishing Limited
Refereed:	Yes
ISSN:	13565362
Depositing User:	MDJ Davies
Date Deposited:	22 Oct 2007 10:44
Last Modified:	27 Sep 2011 12:19
URI:	http://usir.salford.ac.uk/id/eprint/1563

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