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Reliability equivalence for parallel-series systems using a flexible lifetime distribution

Alghamdi, SM and Percy, D. F. 2016, 'Reliability equivalence for parallel-series systems using a flexible lifetime distribution' , IEEE Transactions on Reliability . (In Press)

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The aim of this study is to apply reliability equivalence techniques to a parallel-series system comprising several parallel subsystems connected in series. The lifetimes of all system components are assumed to be independent and identically distributed, according to a generalized quadratic failure rate distribution. Four different methods are used to improve any such system: (a) reduction; (b) hot duplication; (c) cold duplication with perfect switch; (d) cold duplication with imperfect switch. Two measures for comparing system improvements are considered in this paper, survival reliability equivalence factors and mean reliability equivalence factors. Numerical examples are presented for a specific parallel-series formulation, to illustrate how to apply the theoretical results and demonstrate the relative benefits of various system improvements.

Item Type: Article
Schools: Schools > Salford Business School
Journal or Publication Title: IEEE Transactions on Reliability
Publisher: Institute of Electrical and Electronics Engineers
ISSN: 0018-9529
Funders: Saudi Arabian Minstry of Education
Depositing User: Professor D. F. Percy
Date Deposited: 22 Mar 2016 15:23
Last Modified: 22 Mar 2016 15:23

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