Any time probabilistic reasoning for sensor validation
Ibarguengoytia, PH, Sucar, E and Vadera, S 1998, Any time probabilistic reasoning for sensor validation , in: Fourteenth Conference on Uncertainty in Artificial Intelligence, 1998, University of Wisconsin Business School, Madison, Wisconsin, USA.
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For many real time applications, it is important to validate the information received form the sensors before entering higher levels of reasoning. This paper presents an any time probabilistic algorithm for validating the information provided by sensors. The system consists of two Bayesian network models. The first one is a model of the dependencies between sensors and it is used to validate each sensor. It provides a list of potentially faulty sensors. To isolate the real faults, a second Bayesian network is used, which relates the potential faults with the real faults. This second model is also used to make the validation algorithm any time, by validating first the sensors that provide more information. To select the next sensor to validate, and measure the quality of the results at each stage, an entropy function is used. This function captures in a single quantity both the certainty and specificity measures of any time algorithms. Together, both models constitute a mechanism for validating sensors in an any time fashion, providing at each step the probability of correct/faulty for each sensor, and the total quality of theresults. The algorithm has been tested in the validation of temperature sensors of a power plant.
|Item Type:||Conference or Workshop Item (Paper)|
|Uncontrolled Keywords:||sensor validation, Bayesian networks, any time computing, AI|
|Themes:||Subjects / Themes > Q Science > QA Mathematics > QA075 Electronic computers. Computer science|
Subjects outside of the University Themes
|Schools:||Colleges and Schools > College of Science & Technology|
Colleges and Schools > College of Science & Technology > School of Computing, Science and Engineering
Colleges and Schools > College of Science & Technology > School of Computing, Science and Engineering > Data Mining and Pattern Recognition Research Centre
|Journal or Publication Title:||Proc. Fourteenth Conference on Uncertainty in Artificial Intelligence, University of Wisconsin Business School, Madison, Wisconsin, USA,|
|Publisher:||Morgan Kaufmann Publishers, USA|
|Depositing User:||S Vadera|
|Date Deposited:||23 Jun 2010 11:05|
|Last Modified:||20 Aug 2013 17:19|
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