Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source

Held, G, Venturini, F, Grinter, DC ORCID: https://orcid.org/0000-0001-6089-119X, Ferrer, P, Arrigo, R ORCID: https://orcid.org/0000-0002-2877-8733, Deacon, L, Quevedo Garzon, W, Roy, K, Large, A, Stephens, C, Watts, A, Larkin, P, Hand, M, Wang, H, Pratt, L, Mudd, JJ, Richardson, T ORCID: https://orcid.org/0000-0002-3886-9006, Patel, S, Hillman, M and Scott, S 2020, 'Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source' , Journal of Synchrotron Radiation, 27 (5) , pp. 1153-1166.

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Abstract

The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 1010 photons s−1 over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.

Item Type: Article
Schools: Schools > School of Computing, Science and Engineering
Journal or Publication Title: Journal of Synchrotron Radiation
Publisher: International Union of Crystallography
ISSN: 0909-0495
Related URLs:
Depositing User: USIR Admin
Date Deposited: 05 Nov 2020 15:29
Last Modified: 05 Nov 2020 15:30
URI: http://usir.salford.ac.uk/id/eprint/58711

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