A transmission electron microscopy study of inert gases in silicon and iron

Greaves, G 2012, A transmission electron microscopy study of inert gases in silicon and iron , PhD thesis, University of Salford.

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Abstract

This thesis presents a study of inert gas inclusion in iron and silicon, as a result of ion implantation. The effect of ion implantation conditions on the formation and development of inert gas bubbles within these solids has been explored, and the mobility of these nanoscale bubbles during heating has been investigated, linking to work on empirical equations of state. Also reported on, is the observation of a neon bubble superlattice in iron, and some preliminary work investigating the retention of helium in iron, from a high temperature, high pressure diamond anvil cell. For this work, iron samples have been prepared for transmission electron microscopy (TEM) via a focused ion beam system (FIB), while silicon tri-layer samples (monocrystalline silicon — silicon oxide — polycrystalline silicon) were produced by preparing cross-sectional slices of the bulk material by mechanical polishing and ionbeam thinning. These samples were subsequently implanted with helium and neon (also argon in the case of silicon) at the in-situ TEM/ion accelerator MIAMI facility, which is now at the University of Huddersfield. This enabled real-time observation of bubble development, from which micrographs and video have been recorded.

Item Type: Thesis (PhD)
Contributors: Donnelly, S (Supervisor)
Schools: Schools > School of Computing, Science and Engineering
Depositing User: Institutional Repository
Date Deposited: 28 Jul 2021 14:44
Last Modified: 27 Aug 2021 21:56
URI: http://usir.salford.ac.uk/id/eprint/61340

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