Items where Journal is "Condition Monitoring And Machinery Failure Prevention Technologies, 6th International Conference, 2009 (2 Vols)"
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2009
| McCann, M, Li, Y, Maguire, L and Johnston, A 2009, Effective monitoring and process control in semi-conductor manufacturing using feature selection , in: 6th International Conference on Condition Monitoring and Machinery Failure Prevention Technologies 2009, 23-25 June 2009, Dublin, Ireland. Item not available from this repository. |