Items where Journal is "Institute of Electrical and Electronics Engineers (IEEE) Transactions on Reliability"

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Berrade, MD, Scarf, PA ORCID: https://orcid.org/0000-0001-5623-906X and Cavalcante, CAV 2015, 'Some insights into the effect of maintenance quality for a protection system' , Institute of Electrical and Electronics Engineers (IEEE) Transactions on Reliability, 64 (2) , pp. 661-672.
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This list was generated on Sat Jul 24 01:52:31 2021 UTC.